吉林大学学报(信息科学版) ›› 2021, Vol. 39 ›› Issue (3): 318-323.

• • 上一篇    下一篇

硅基 PN 结型光波导有效折射率的定量分析

孙圣现a,b , 陈柏松a,b , 李雨轩a,b , 李盈祉a,b , 张蓝萱a,b , 陶 敏a,b , 宋俊峰a,b   

  1. 吉林大学 a. 电子科学与工程学院; b. 集成光电子学国家重点实验室, 长春 130012
  • 收稿日期:2021-01-28 出版日期:2021-05-24 发布日期:2021-05-25
  • 通讯作者: 宋俊峰(1971— ), 男, 吉林白城人, 吉林大学教授, 博士生导师, 主要从事硅基光电子集成器件与系统研究, (Tel)86-18644936571(E-mail)songjf@jlu.edu.cn
  • 作者简介:孙圣现(1996— ), 男, 黑龙江七台河人, 吉林大学硕士研究生, 主要从事激光雷达及其控制电路研究, (Tel) 86-18443143245(E-mail)sunsx18@mails.jlu.edu.cn
  • 基金资助:
    国家重点研发计划基金资助项目(2016YFE0200700); 国家自然科学基金资助项目(61627820; 61934003; 62090054); 吉林省重大科技专项基金资助项目(20200501007GX)

Effective Refractive Index Quantitative Analysis of Silicon-Based PN Junction Optical Waveguide

SUN Shengxiana,b , CHEN Bosonga,b , LI Yuxuana,b , LI Yingzhia,b , ZHANG Lanxuana,b , TAO Mina,b , SONG Junfenga,b   

  1. a. College of Electronic Science and Engineering; b. State Key Laboratory of Integrated Optoelectronics, Jilin University, Changchun 130012, China
  • Received:2021-01-28 Online:2021-05-24 Published:2021-05-25

摘要: 为解决脊型波导相位调制的有效折射率测量问题, 提出一种 3 端口 MZI(Mach-Zehnder Interferometer)结构, 能定量测量并分析 PN 结(Positive-Negative junction)脊型硅光波导中, 有效折射率的实部和虚部受偏置电压调制的相对变化, 并给出多项式拟合方程。 实验所得结果与拟合结果非常符合, 最终可以得到脊型波导在相位调制过程中的特性。 该测量方法简单易行, 可应用于硅基光电子集成芯片当中, 作为载流子调制特性定量检测器件。

关键词: 硅基光波导 , 载流子色散 , 高速硅基光电调制器 , 马赫-曾德尔调制器 , 相位调制

Abstract: In order to solve the effective refractive index measurement problem of the ridged waveguide phase modulation, a three-port MZI(Mach-Zehnder Interferometer) structure is proposed. It can quantitatively measure and analyze the relative changes of the real and imaginary parts of the effective refractive index with the voltage varies of the PN ridged silicon optical waveguide and the polynomial fitting equation is derived. The experimental results are in good agreement with the fitting results, and then finally the characteristics of the ridged waveguide in the phase modulation process are obtained. This measurement method is simple and feasible, and can be used in silicon based optoelectronic integrated chips as a quantitative device for the detection of carrier modulation characteristics.

Key words: silicon-on-insulator waveguides, carrier dispersion, high-speed silicon photoelectric modulator, Mach-Zehnder modulator, phase modulation

中图分类号: 

  • TN252