吉林大学学报(信息科学版) ›› 2014, Vol. 32 ›› Issue (3): 308-315.

• 论文 • 上一篇    下一篇

基于Halcon的硒鼓缺陷检测与一维尺寸测量

朱先锋, 潘洪军   

  1. 浙江海洋学院 数理与信息学院, 浙江 舟山 316000
  • 收稿日期:2013-06-20 出版日期:2014-05-24 发布日期:2014-07-18
  • 作者简介:朱先锋(1989—), 男, 江苏睢宁人, 浙江海洋学院硕士研究生, 主要从事计算机视觉研究, (Tel)86-18368086367(E-mail)ilanliu90@yahoo.com.cn; 通讯作者:潘洪军(1966—), 男, 吉林桑树台人, 浙江海洋学院教授, 博士, 硕士生导师, 主要从事计算机软件与理论研究, (Tel)86-15088875366(E-mail)Hongjunp66@163.com。
  • 基金资助:

    浙江省科技厅基金资助项目(2011C11045)

Defect Detection and One-Dimensional Size Measurement of Toner Cartridge Based on Halcon

ZHU Xianfeng, PAN Hongjun   

  1. School of Mathematics, Physics and Information Science, Zhejiang Ocean University, Zhoushan 316000, China
  • Received:2013-06-20 Online:2014-05-24 Published:2014-07-18

摘要:

为实现硒鼓表面缺陷检测和尺寸测量的自动化, 运用图像处理算法中的数学形态学算子对硒鼓表面点缺陷和线缺陷进行精确检测与分类, 并根据亚像素测量方法对硒鼓尺寸进行精确测量, 通过机器视觉专用软件Halcon和.NET开发了硒鼓缺陷自动检测与尺寸测量系统。测试结果表明, 该方法与应用像素级测量法相比, 其精度提高1~2个像素, 具有精度高、 稳定性强等优点。

关键词: 形态学算子, 缺陷检测, 亚像素测量

Abstract:

Surface defect detection and size measurement of the toner cartridge is an important part to determine whether it is qualified. To achieve this aspect of work automation, the toner cartridge surface point defects and line defects are accurately detected and classified by mathematical morphology operators of image processing algorithms, and its size is precisely measured according to sub-pixel measurements. The cartridge automatic defect detection and size measurement system is developed by the special machine vision software Halcon and .NET. Testing shows that the system has a high accuracy, speed, stability and other distinctive characteristics.

Key words: morphology operator, defect detection, sub-pixel measurement

中图分类号: 

  • TP391