Abstract: In order to achieve the rapid test of the optical phase control performance of the optical phased array (OPA: Optical Phased Array), i. e. to quickly test the configuration voltage corresponding to the OPA beam scanning angle, a closed-loop test system with self-feedback function is designed. The 64-channel drive power supply is controlled by the host computer to provide the configuration voltage for the OPA. The far-infrared camera detects the light field distribution of the OPA's emitted light on the Imaging screen, and the beam scanning angle is determined according to the main lobe position. Then we compare the deflection angle with the preset deflection angle by cosine similarity, and further adjust the configuration voltage of each OPA until the best actual configuration voltage corresponding to the set beam scanning angle is obtained. Experiments have proved that the system can achieve a rapid test of 64 configuration voltages corresponding to the OPA specified beam scanning angle within 16 minutes, and the peak sidelobe level obtained is about -10 dB. The system has high stability, strong anti-interference ability and fast speed.

Key words: optical phased array (OPA), beam scanning angle, closed loop test system, beam phase control