Abstract: In order to solve the performance degradation problem that may be introduced by typical analog
circuits in the design stage，the research progress of circuit virtual verification technology is analyzed at home and
abroad，the mechanism models such as HCI ( Hot Carrier Induced ) ，NBTI ( Negative Bias Temperature
Instability) and TDDB ( Time Dependent Dielectric Breakdoun) which cause the performance degradation of
analog circuits are deeply studied． Furthermore，three key tasks are carried out which contains the design of
performance degradation simulation process model，the derivation of the failure physical model and the extraction
of model parameters． Based on the research，a typical analog operational amplifier is selected to simulation the
performance degradation by Cadence spectre software． The performance degradation of the device proves that the
proposed simulation method is feasible at 25 ℃ after two years and ten years of operation． This conclusion can
provide preliminary support information for the improvement design work in the design stage of the analog circuit．

Key words: analog circuit, performance degradation, reliability, simulation