Abstract:

 Optical properties of copper phthalocyanine (CuPc) and perfluorinated copper phthalocyanine (F₁₆CuPc) thin films were studied by means of spectroscopic ellipsometry on  a variable angle spectrometric ellipsometer. Thin films of these phthalocyanines were prepared on single crystal silicon substrates. Spectroscopic ellipsometry measurements were performed at different angles of incidence (55°,60°,65° and 70°) in a wavelength range of 248~1 650 nm (0.75~5 eV). The spectral dependences of optical constants, dielectric functions and absorption coefficients of these films were obtained by the simultaneous point\|by\|point fitting of the experimental data. It has been found that the substituting groups on the conjugated phthalocyanine macrocycles strongly influence resonance wavelength and abnormal dispersion of the thin films. The optical band gap (E_g) of each material was also derived from the extrapolation of the edge of  absorption.

Key words: optical constant, ellipsometric spectrum, phthalocyanine film, substitute, dielectric function