J4

• 化学 • Previous Articles     Next Articles

Effects of Pr Dopant on Structure andElectrical Properties of Ce0.87Sm0.13O2-δ

ZHOU Defeng1,2, LI Zhaohui1, LI Lian gui1, MENG Jian2   

  1. 1. School of Biological Engineering, Changchun University of Technology, Changchun 130012, China; 2. Key Laboratory of Rare Earth Chemistry and Physics, Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
  • Received:2007-07-25 Revised:1900-01-01 Online:2008-05-26 Published:2008-05-26
  • Contact: ZHOU Defeng

Abstract: Materials formulated Ce0.87Sm0.13-xPrxO2-δ(x=0.00, 0.01, 0.02) were prepared by solgel method. Structural and electrical properties of the materials were investigated by means of X-ray diffraction (XRD), Raman, X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FE-SEM)and AC impedance spectroscopy. The effects of small amounts of Pr doping on microstructure and electrical conductivity of the material were discussed. The results show that the Pr doping could reduce or eliminatethe dents and pores on the grain surface and the grain boundary, which results in the lower electrode interface and grain boundary resistance. The relative density of the materials is increased remarkably. And the contribution of grain boundary resistance to the total resistance is reduced significantly.

Key words: solid state electrolyte, conductivity, grain boundary, solid oxide fuel cell (SOFC)

CLC Number: 

  • O614.111