Abnormality Detection of Capacitive Equipment Based on Wavelet Tree
YU Qiangyuan1,2, FAN Shichao1, JIN Chengye3
1. College of Computer Science and Technology, Jilin University, Changchun 130012, China;2. Key Laboratory of Symbolic Computation and Knowledge
Engineering of Ministry of Education, [JP+1]Jilin University, Changchun 130012, China; 3. Jilin Province Lejin Electronic Co. Ltd., Changchun 130062, China
YU Qiangyuan, FAN Shichao, JIN Chengye. Abnormality Detection of Capacitive Equipment Based on Wavelet Tree[J].Journal of Jilin University Science Edition, 2015, 53(06): 1275-1281.