J4 ›› 2012, Vol. 50 ›› Issue (01): 122-125.

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Preparation and Performance Characterization |of Zinc Oxide Thin Films by Means of Sol Gel Method

XIN Chun yu1,  |ZHANG Ji de1,  |LIU Cheng you2,  |JIANG Da yong3,  |QIN Jie ming3   

  1. 1. Department of Physics, Baicheng Normal University, Baicheng 137000, Jilin Province, China|2. Department of Physics, Tonghua Normal University, Tonghua 134001, Jilin Province, China|3. School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • Received:2011-01-26 Online:2012-01-26 Published:2012-03-06
  • Contact: XIN Chun yu E-mail:xinchunyu001@tom.com

Abstract:

Zinc oxide thin films were synthesized on  glass substrates by means of sol\|gel method.The X\|ray diffraction (XRD) results show  that the grain size increased with the increasing of annealing temperature, which was confirmed by the morphology by atomic force microscopy (AFM). The   UV\|Vis results show  that there is a stronger absorption on the near band edge of zinc oxide and the  bandgap of the film at 600 ℃ by means of annealing treatment is 3.23 eV. Room\|temperature photoluminescence (PL) results show that all films  show UV emission peak at  386.5 nm, the deep level emission is restrained by the increase of annealing temperature.

Key words: sol-gel method, zinc oxide thin film, optical property

CLC Number: 

  • TN814