Abstract: The identification of minerals under the reflective polarizing microscope is the most commonly used, quickest, and effective method. However, the identification results are easily affected by personal subjective factors and conditions of the polished section. If we know the elements in the polished section in advance and relative content, we can conjecture the minerals based on geochemical methods and experiences, and the composition data combined with microscope observation can greatly improve the efficiency and accuracy of polished section identification. XRF semi-quantitative analysis technology has the characteristics of fast, non-destructive and simple in sample preparation. In the process of semi-quantitative analysis of the polished section, wedging and shadow effects can be avoided; although the gangue minerals such as silicate minerals cannot be avoided, and there may be even some other influencing factors such as chemical bond drift, the identification of gangue minerals is not very important. Using the results of XRF semi-quantitative analysis to conjecture the minerals, and then identify the minerals under a microscope, the efficiency and accuracy of polished section identification can be improved significantly. In order to illustrate the specific application of XRF semi-quantitative analysis technology in identification of polished section, several examples of polished section identification of polymetallic sulfide ores and uranium-containing polymetallic ores are listed.

Key words: XRF, semi-quantitative analysis, ore polished section, identification