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• 电子科学 • 上一篇    下一篇

半导体高功率量子阱激光器退火后的电噪声

石英学, 李靖, 郭树旭, 张素梅, 王雪丹, 石家纬   

  1. 集成光电子学国家重点联合实验室, 吉林大学电子科学与工程学院, 长春 130023
  • 收稿日期:2004-01-05 修回日期:1900-01-01 出版日期:2004-10-26 发布日期:2004-10-26
  • 通讯作者: 石家纬

Electric noise of high-power quantum well semiconductor lasers after annealing

SHI Ying-xue, LI Jing, GUO Shu-xu, ZHANG Su-mei, WANG Xue-dan, SHI Jia-wei   

  1. State Key United Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering,Jilin University, Changchun 130023, China
  • Received:2004-01-05 Revised:1900-01-01 Online:2004-10-26 Published:2004-10-26
  • Contact: SHI Jia-wei

摘要: 在环境温度和工作电流下, 对808 nm高功率量子阱激光器进行老化实验, 发现在老化过程中一些劣质器件电噪声谱密度呈下降趋势, 产生退火效应. 本文应用初始性缺陷(高温高能条件下所形成的缺陷)和非初始性缺陷理论, 探讨了器件发生退火及早期失效的原因.

关键词: 半导体激光器, 噪声, 退火

Abstract: The electric noise spectral density of 808 nm high-power quantum well semiconductor laser diode showed a descending trend on aging process, producing annealing effect. In this paper, by inducing the theory of initial defect(It is induced by high temperature and high stress)and non-initial defect, the reason of producing the annealing and forepart failure is discussed.

Key words: semiconductor laser, noise, annealing

中图分类号: 

  • TN365