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• 电子科学 • 上一篇    下一篇

控制界面态减少表面可动电荷降低晶体管的电噪声

石英学, 李 靖, 郭树旭, 张素梅, 王雪丹, 石家纬   

  1. 集成光电子学国家重点联合实验室吉林大学分区, 长春 130012
  • 收稿日期:2004-01-05 修回日期:1900-01-01 出版日期:2005-01-26 发布日期:2005-01-20
  • 通讯作者: 石家纬

Controlling Interface State to Lower Electric Noise and Surface Movable Charge

SHI Ying-xue, LI Jing, GUO Shu-xu, ZHANG Su-mei, WANG Xue-dan, SHI Jia-wei   

  1. State Key United Laboratory on Integrated Optoelectronics, Jilin University Region, Changchun 130012, China
  • Received:2004-01-05 Revised:1900-01-01 Online:2005-01-26 Published:2005-01-20
  • Contact: SHI Jia-wei

摘要: 通过对比2688B, 2688S, 2688 3种工艺技术生产的彩色 电视机高频视放晶体管的CB结反向漏电流Icbo和电噪声谱密度Svcb (f), 论述了界面态和表面可动电荷能够引起晶体管表面漏电流, 从而使器件产生电噪声, 并间接影响到反向击穿电压、 小电流放大系数等参数. 实验表明, 采用合适的表面钝化技术, 可有效控制晶体管的表面漏电流, 降低晶体管的电噪声, 使器件的可靠性、 稳定性及其使用寿命得到提高.

关键词: 噪声, 可靠性, 晶体管

Abstract: The paper contrasted CB junction reverse leak currents Icbo and electronic noise spectrums Svcb(f) of color TV high frequency video transistors(2688B, 2688S, 2688) produced by three kinds of techniques. Its discussed that interface state and surface movable charge cause surface leak current, which make devices produce electronic noise and affect other parameters such as reverse breakdown voltage and small current amplif ying coefficient. The experiment showed that surface leak current can be controlled, transistor electronic noise can be lowered and the reliability, stability and life can be enhanced by adopting surface passivation technique.

Key words: noise, reliability, transistor

中图分类号: 

  • TN365