吉林大学学报(理学版)

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空位缺陷对CrSi2光电性能的影响

于立军1, 张春红2, 张忠政2, 邓永荣2, 闫万珺2   

  1. 1. 长春师范大学 物理学院, 长春 130032; 2. 安顺学院 航空电子电气与信息网络工程中心, 贵州 安顺 561000
  • 收稿日期:2015-02-10 出版日期:2015-05-26 发布日期:2015-05-21
  • 通讯作者: 闫万珺 E-mail:yanwanjun7817@163.com

OpticalElectrical Characteristics of CrSi2 with Vacancy Defect

YU Lijun1, ZHANG Chunhong2, ZHANG Zhongzheng2,DENG Yongrong2, YAN Wanjun2   

  1. 1. College of Physics, Changchun Normal University, Changchun 130032, China;2. Engineering Center of Avionics Electrical and Information Network, Anshun University,Anshun 561000, Guizhou Province, China
  • Received:2015-02-10 Online:2015-05-26 Published:2015-05-21
  • Contact: YAN Wanjun E-mail:yanwanjun7817@163.com

摘要:

采用第一性原理方法, 计算含空位缺陷CrSi2的电子结构和光学性质, 并分析含Cr和Si空位缺陷的CrSi2光电性能. 结果表明: Cr和Si空位均使CrSi2的晶格常数和体积变小; 能带结构密集而平缓, 且整体向上移动, Si空位缺陷形成带隙宽度为0.35 eV的p型间接带隙半导体, Cr空位缺陷在原禁带间出现两条新的能带; 含空位缺陷CrSi2的电子态密度仍主要由Cr 3d层电子贡献, Si空位缺陷对电子态密度的影响较小, Cr空位缺陷提高了Fermi面处的电子态密度; 与CrSi2相比, 含空位缺陷CrSi2的介电峰均向低能方向略有偏移且峰值降低, 吸收系数明显变小.

关键词: CrSi2, 空位缺陷, 光电性能, 第一性原理

Abstract:

The electronic structure and optical properties of CrSi2 with vacancy defect were calculated based on the first principles method, and the photoelectric properties of CrSi2 with Cr or Si vacancy defect were analyzed. The results show that the lattice constants and volume are all decreased with Cr or Si vacancy defect. The band structure becomes intensive and gentle, and moves upward. The band structure of CrSi2 with Si vacancy defect is p type indirect semiconductor with a band gap of 0.35 eV; while two new energy levels are induced in the forbidden band with Crvacancy defect. Density of states of
 the valence band top and conduction band bottom are mainly composed of Cr 3d. Sivacancy defect has a little effect on the density of states; Crvacancy defect improves the density of states of the Fermi energy. Compared with that of pure CrSi2, the dielectric peak slightly moves to the lower energy and decreases with vacancy defect, and the absorption index obviously decreases.

Key words: CrSi2; vacancy defect; photoelectric properties; , the first principle

中图分类号: 

  • O474