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Growth and Electrical Properties of ZnO Films Deposited on Freestanding Thick Diamond Films

SUN Jian1,2, BAI Yi zhen1,2, YANG Tian peng3, SUN Jing chang2, DU Guo tong2,3   

  1. 1. State Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Dalian 116023, Liaoning Province, China; 2. College of Physics and Opto\|electronic Engineering, Dalian University of Technology, Dalian 116023, China; 3. State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • Received:2006-11-01 Revised:1900-01-01 Online:2007-09-26 Published:2007-09-26
  • Contact: BAI Yi zhen

Abstract: ZnO thin films were prepared on the smooth nucleation surfaces of freestanding CVD thick diamond films by metal organic chemical vapor deposition (MOCVD) with two-step growth method. The growth and electrical properties of the ZnO films are characterized experimentally. The ZnO film deposited at a substrate temperature of 600 ℃ exhibited a clean surface with c-preferred orientation and had a mobility of 3.79 cm2/(V·s).

Key words: SAW filter, diamond, ZnO film, metal organic chemical vapor deposition

CLC Number: 

  • O484.5