J4

• 物理 • Previous Articles     Next Articles

MonteCarlo Calculation of XRay Dosedistribution Nearby AuCuPc Interface with Different Thicknesses of Au

ZHANG Hui, ZHAO Guangyi, ZHAO Baokui, MA Yugang, LI Xianfeng, DONG Wenbin, ZHANG Jianfang, LI Haibo, MIAO Chuang, LIU Guangtao, WANG Wenquan   

  1. College of Physics, Jilin University, Changchun 130021, China
  • Received:2007-11-27 Revised:1900-01-01 Online:2008-11-26 Published:2008-11-26
  • Contact: ZHAO Guangyi

Abstract: The doseenhancementfactors of different thicknesses of AuCuPc interfaces were calculated via MonteCarlo method. The calculated results demonstrate that the thickness of Au has an distinct effect on dose enhancement of Xray nearby the AuCuPc interface. When the thickness of Au is 0~8 μm, doseenhancementfactor of X-ray increases along with the increase of the thickness of Au.

Key words: MonteCarlo method, organic semiconductor, doseenhancementfactor, interface

CLC Number: 

  • O434.1