Abstract:

Ideality factor is closely correlated with the reliability of laser diode (LD). The measured ideality factor of narrow\|strip LD (2~3) is larger than that of wide\|strip LD (1~2). In consideration of the structural difference between wide\|strip and   narrow\|strip LDs, the simulation based on ORCAD was employed on the two types of LDs. The simulated and experimental results indicate that the current expansion is an important factor to affect measured ideality factor. The higher the ability to limit current in active region is, the lower the measured ideality factor is.

Key words: laser diode （LD）, reliability, ideality factor, electrical derivative