吉林大学学报(工学版) ›› 2003, Vol. ›› Issue (1): 73-76.

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Research and Development on the New Type of Control System for Magnetic Particle Flaw Detector

ZHOU Yuan1, SUN Xiao2, LIU Ming-shan3, PAN Gang-yi 4   

  1. 1. Changchun Research Institute of Testing Machine, Changchun 130021, China;
    2. College of Mechanical Science and Engineering, Jilin University, Changchun 130025, China;
    3. College of Communication Engineering, Jilin University, Changchun 130025, China;
    4. Vehicle Checking Workroom , Changchun Railroad Carriage Manufacturing Plant Railway Department of China, Changchun 130062, China
  • Received:2002-06-25

Abstract: Applying PLC in phaser and time sequence control of controllable silicon,a new type of control system used to control the phaser and time sequence of controllable silicon has been developed for the magnetic particle flaw detector.With the appropriate structure,the control system works steadily and reliably.Anti interference and control accuracy of the system are greatly improved.

Key words: magnetic particle flaw inspection, programmable logical controller, auto-control system

CLC Number: 

  • TH878
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[2] 周原.一种新型可控硅移相触发控制系统[Z].第七届全国无损检测年会,重庆,1996.
[3] 朱绍祥,张宏生,殷锡章.可编程控制器原理与应用[M].上海:上海交通大学出版社,1991.
[4] 赵松年,戴志义.机电一体化数控系统设计[M].北京:机械工业出版社,1994.
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