J4 ›› 2010, Vol. 48 ›› Issue (05): 840-842.

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Raman Spectra of ZnO Whisker at Various Temperatures

GUO Xing yuan, DING Zhan hui, XUE Yan |feng, XU Ji lian, YI Yan lei, |LI Liang, ZHOU Jing, XU Da peng   

  1. College of Physics, |Jilin University, Changchun |130012, China
  • Received:2010-03-11 Online:2010-09-26 Published:2010-09-21
  • Contact: GUO Xing yuan E-mail:guoxy@jlu.edu.cn

Abstract:

ZnO (wurtzite) whiskers were grown via a floating zone method. The as-grown samples were characterized by X-ray diffraction and polarizing microscopy. Their characteristic peaks verify that the as-grown ZnO whiskers have excellent hexagonal wurtzite phase and (100) orientation. Raman scattering results show that  when  temperature was 93~706 K, the  frequency was red shift with the temperature increasing. When temperature was up to 500 K, the line width of Ehigh2 mode broadened with the temperature increasing, ZnO elements turned into activity  status, Raman mode frequency was significant hardening.

Key words: zinc oxide, whisker, X-ray diffraction, Raman spectrum, polarizing microscope

CLC Number: 

  • O433.3