J4 ›› 2012, Vol. 50 ›› Issue (01): 126-128.

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X-Ray Diffraction Patterns of Quenched and Annealed Nylon 6 Crystals

WANG Zhao |hong1,  |LI Yong hua2,  |MENG Fan ling3,  |ZHAO Zhu di3   

  1. 1. Jilin Institute of Metrology, Changchun 130012, China|2. College of Sciences, Harbin Engineering University, Harbin 150001, China|3. College of Materials Science and Engineering, Jilin University, Changchun 130012, China
  • Received:2011-05-24 Online:2012-01-26 Published:2012-03-06
  • Contact: ZHAO Zhu di E-mail:zhaozd@jlu.edu.cn

Abstract:

Nylon 6 films were prepared by means of quenching after isothermal crystallization and annealing. The crystallization behavior of the nylon 6 films was investigated via X\|ray diffraction. When the temperature was higher than 443 K isothermal crystallization and the temperature was higher than 473 K for annealing of nylon 6, a high temperature crystallization peak appears at 2θ=28.5°. The intensity of high temperature crystallization peak depends on the thermal history of the film. If the films were cooled in air after isothermal crystallization and annealing, no high temperature crystallization peak exists. The possible causes of the high temperature crystallization peak were analyzed based on the experiment results.

Key words: nylon 6; , X-ray diffraction; , high temperature crystallization peak

CLC Number: 

  • TB332