Detection of the Coating/Substrate Bonding Properties with Laser Excitation and Interferometer Test
SUN Jian1, JIN Wei1, HAN Qingbang2
1. School of Science, Xi’an University of Posts and Telecommunications, Xi’an 710121, China;2. College of IOT Engineering, Hohai University, Changzhou 213022, Jiangsu Province, China
SUN Jian, JIN Wei, HAN Qingbang. Detection of the Coating/Substrate Bonding Properties with Laser Excitation and Interferometer Test[J].Journal of Jilin University Science Edition, 2014, 52(05): 1027-1030.