吉林大学学报(工学版) ›› 2004, Vol. ›› Issue (1): 132-134.
Previous Articles Next Articles
ZHOU Qiu-zhan, WANG Shu-xun, QIAN Zhi-hong
CLC Number:
| [1] XU Jiansheng, ABBOTT Derek,DAI Yisong. 1/ƒ, g±r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices［J］.Microelectronics Reliability,2000,40:171-178. [2] VANDAMME L K J.Noise as a diagnostic tool for quality and reliability of electronic devices［J］.IEEE Trans on Electronic Devices,1994,41(11):2176-2187. [3] JEVTIC M M.Noise as a diagnostic and prediction tool in reliability physics［J］.Microelectron Reliab,1995,35(3):455-477. [4] JONES B K.Excess noise and reliability in electronic devices［Z］.ICFN'95, Lithuania,1995:573-578. [5] DAI Yisong,XU Jiansheng.The noise analysis and noise reliability indicators of optoelectron coupled devices［J］.Solid-State Electronics,2000,44:1495-1500. [6] DAI Yisong, XU Jiansheng, ZHANG Xinfa. A study of optical noise measurement as a reliability estimation for laser diodes［J］.Microelectron Reliab,1995,35(4):731-734. [7] 周求湛,戴逸松.用于低频噪声自动测试系统的GPIB卡数据通信的软件设计［J］.吉林工业大学学报增刊,1999. [8] DAI Yisong.A precision noise measurement and analysis method used to estimate reliability of semiconductor device［J］.Microelectron Reliab,1997,37(6):892-893. [9] MARQUARDT D W.An algorithm for least squares estimation of nonlinear parameters［J］.J Soc Ind Appl Math,1963,11:431-441. |
| [1] |
ZHOU Qiu-zhan, ZHANG Yuan，SUN Yu-jing, ZHANG He-bin, XIE Ning .
Timedomain screening method of the reliability of optoelectron coupled devices based on independent component analysis [J]. 吉林大学学报(工学版), 2008, 38(05): 1242-1247. |
|
||