Abstract:

    According to the denoising theory based on the nonlinear diffusion equation, the nonlinear diffusion equation was applied to denoising of electrical derivative data of semiconductor laser diode (LD). Comparing with the denoising method based on mean value filtering, the experiment results indicated that this denoising method can reduce the noise in electrical derivative data of LD more effectively, and moreover the dip height of the electrical derivative curve at the threshold current can be preserved. The errors in parameters obtained from the measured electrical derivative curve were reduced too. The quality and reliability of LD can be estimated effectively using parameters from the measured electrical derivative curve after being denoised.

Key words: optoelectronics and laser, semiconductor laser diode, diffusion equation, electrical derivative, reliability, data denoising