淬火和退火后尼龙6的X射线衍射谱

J4 ›› 2012, Vol. 50 ›› Issue (01): 126-128.

淬火和退火后尼龙6的X射线衍射谱

王肇虹¹, 李永华², 孟繁玲³, |赵竹第^3

1. 吉林省计量科学研究院, 长春 130012|2. 哈尔滨工程大学理学院, 哈尔滨 150001|3. 吉林大学材料科学与工程学院, |长春 |130012

收稿日期:2011-05-24 出版日期:2012-01-26 发布日期:2012-03-06
通讯作者: 赵竹第 E-mail:zhaozd@jlu.edu.cn

X-Ray Diffraction Patterns of Quenched and Annealed Nylon 6 Crystals

WANG Zhao |hong¹, |LI Yong hua², |MENG Fan ling^3, |ZHAO Zhu di^3

1. Jilin Institute of Metrology, Changchun 130012, China|2. College of Sciences, Harbin Engineering University, Harbin 150001, China|3. College of Materials Science and Engineering, Jilin University, Changchun 130012, China

Received:2011-05-24 Online:2012-01-26 Published:2012-03-06
Contact: ZHAO Zhu di E-mail:zhaozd@jlu.edu.cn

摘要/Abstract

摘要：

采用X射线衍射研究尼龙6等温结晶后淬火和退火的结晶行为, 并根据实验结果分析了高温结晶峰产生的原因. 结果表明: 在温度高于443 K等温结晶和温度高于473 K退火的尼龙6中, 在2θ=28.5°处出现一个高温结晶衍射峰; 高温结晶峰的强度与尼龙6薄膜的热历史有关, 若尼龙6在等温结晶和退火后空冷, 则无高温结晶峰存在.

关键词: 尼龙6, X射线衍射, 高温结晶衍射峰

Abstract:

Nylon 6 films were prepared by means of quenching after isothermal crystallization and annealing. The crystallization behavior of the nylon 6 films was investigated via X\|ray diffraction. When the temperature was higher than 443 K isothermal crystallization and the temperature was higher than 473 K for annealing of nylon 6, a high temperature crystallization peak appears at 2θ=28.5°. The intensity of high temperature crystallization peak depends on the thermal history of the film. If the films were cooled in air after isothermal crystallization and annealing, no high temperature crystallization peak exists. The possible causes of the high temperature crystallization peak were analyzed based on the experiment results.

Key words: nylon 6; , X-ray diffraction; , high temperature crystallization peak

中图分类号:

TB332

王肇虹, 李永华, 孟繁玲, 赵竹第. 淬火和退火后尼龙6的X射线衍射谱[J]. J4, 2012, 50(01): 126-128.

WANG Zhao hong, LI Yong hua, MENG Fan ling, ZHAO Zhu di. X-Ray Diffraction Patterns of Quenched and Annealed Nylon 6 Crystals[J]. J4, 2012, 50(01): 126-128.

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