分形几何及其在磁盘表面形貌分析中的应用

吉林大学学报(工学版) ›› 2002, Vol. ›› Issue (2): 40-44.

分形几何及其在磁盘表面形貌分析中的应用

夏学军, 谭庆昌

吉林大学机械科学与工程学院, 吉林, 长春, 130025

收稿日期:2001-10-18

Fractal Theory and Its Application to Rigid Disk Surface Topography

XIA Xue-jun, TAN Qing-chang

College of Mechanical Science & Engineering, Jilin University, Changchun 130025, China

Received:2001-10-18

摘要/Abstract

摘要： 以硬盘表面形貌分析为例,分别介绍了使用功率谱和结构函数获取分形参数的方法,并对测量尺度的取值范围作了探讨。实验结果表明,分形维数能很好地表征表面轮廓,可为进一步的接触分析提供更合理的几何模型。

关键词: 分形几何, 表面形貌, 接触状态, 磁盘

Abstract: Traditional statistical parameters of rough surface are dependent of sampling interval and resolution of the instrument.Fractal parameters can be used to characterize surface profile because of their scale independent and self affinity.Taking rigid disk surface as an example,fractal parameters are obtained by means of power spectrum and structure function,providing a proper geometric model for further contact analysis.

Key words: fractal geometry, surface topography, contact, disk

中图分类号:

O211.6

夏学军, 谭庆昌. 分形几何及其在磁盘表面形貌分析中的应用[J]. 吉林大学学报(工学版), 2002, (2): 40-44.

XIA Xue-jun, TAN Qing-chang . Fractal Theory and Its Application to Rigid Disk Surface Topography[J]. 吉林大学学报(工学版), 2002, (2): 40-44.

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