LM算法在 OCD 低频噪声参数拟合中的应用

吉林大学学报(工学版) ›› 2004, Vol. ›› Issue (1): 132-134.

LM算法在 OCD 低频噪声参数拟合中的应用

周求湛, 王树勋, 钱志鸿

吉林大学, 通信工程学院, 吉林, 长春, 130025

收稿日期:2003-01-28 出版日期:2004-01-01
基金资助:
吉林省科技发展计划资助项目(19990530;20010582);吉林大学创新基金资助项目.

Application of low frequency noise parameters fitting in OCD with LM algorithm

ZHOU Qiu-zhan, WANG Shu-xun, QIAN Zhi-hong

College Communication Engineering, Jilin University, Changchun 130025, China

Received:2003-01-28 Online:2004-01-01

摘要/Abstract

摘要： 用测量低频噪声的方法对航天用光电耦合器件(Optoelectronic Coupled Devices,OCD)的可靠性进行了筛选,并在测量大量OCD器件的基础上,采用Levenberg-Marquardt(LM)算法对实际噪声功率谱进行了低频噪声谱参数拟合,进而确定了导致噪声增加的器件内部缺陷。该方法快速有效,为改进光电耦合器件的生产工艺,提高产品的质量和可靠性提供了理论依据。

关键词: 光电耦合器件, 低频噪声, LM算法, 参数拟合

Abstract: A reliability selectionmethod for astronautic optoelectronic coupled devices(OCD) by using low frequency noise measuring was presented.Based on large amount of measurement for OCD,with Levenberg-Marquardt algoritm,the fit for real curve of low frequency noise spectrum parameters was conducted in order to detect defects leading to the noise increase in the devices.Practical application for OCD selection proved that this method is valid and fast,and can provide a theoretical foundation to improve OCD production techniques,qualities,and reliabilities.

Key words: OCD, low-frequency noise, Levenberg-Marquardt algorithm, parameter fitting

中图分类号:

O241.5

周求湛, 王树勋, 钱志鸿. LM算法在 OCD 低频噪声参数拟合中的应用[J]. 吉林大学学报(工学版), 2004, (1): 132-134.

ZHOU Qiu-zhan, WANG Shu-xun, QIAN Zhi-hong. Application of low frequency noise parameters fitting in OCD with LM algorithm[J]. 吉林大学学报(工学版), 2004, (1): 132-134.

参考文献

[1] XU Jiansheng, ABBOTT Derek,DAI Yisong. 1/ƒ, g±r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices［J］.Microelectronics Reliability,2000,40:171-178.
[2] VANDAMME L K J.Noise as a diagnostic tool for quality and reliability of electronic devices［J］.IEEE Trans on Electronic Devices,1994,41(11):2176-2187.
[3] JEVTIC M M.Noise as a diagnostic and prediction tool in reliability physics［J］.Microelectron Reliab,1995,35(3):455-477.
[4] JONES B K.Excess noise and reliability in electronic devices［Z］.ICFN'95, Lithuania,1995:573-578.
[5] DAI Yisong,XU Jiansheng.The noise analysis and noise reliability indicators of optoelectron coupled devices［J］.Solid-State Electronics,2000,44:1495-1500.
[6] DAI Yisong, XU Jiansheng, ZHANG Xinfa. A study of optical noise measurement as a reliability estimation for laser diodes［J］.Microelectron Reliab,1995,35(4):731-734.
[7] 周求湛,戴逸松.用于低频噪声自动测试系统的GPIB卡数据通信的软件设计［J］.吉林工业大学学报增刊,1999.
[8] DAI Yisong.A precision noise measurement and analysis method used to estimate reliability of semiconductor device［J］.Microelectron Reliab,1997,37(6):892-893.
[9] MARQUARDT D W.An algorithm for least squares estimation of nonlinear parameters［J］.J Soc Ind Appl Math,1963,11:431-441.

Metrics

Viewed

Full text

Abstract

Cited

Shared

Discussed