关键词: 光电子与激光技术, SCPI语言, 程控电流源, 激光器列阵, 无损检测

Abstract: The control of the highpower direct current supply SM3545 which has been used successfully in the nondestructive testing of the highpower semiconductor laser device array(LDA)was realized using the language SCPI in the integrated development environment Visual C++.NET. Supplying stepped constant current to LDAs,their quality and reliability were tested and evaluated by their characteristics of V,IdV/DI,P,and dP/dI versus I,etc. The test results indicate that the parameters such as stability degree and ripple coefficient of this power supply satisfied the need of LDA driving,and the extracted parameters to evaluate the quality and reliabity of the LDA, m,b are exact and steady.It can be concluded that the developed testing system demonstrates excellent performance and stability.

Key words: optoelectronics and laser, SCPI, programmable controlled current source, laser device array(LDA), nondestructive testing